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Defense: Dynamical Evolution of Dielectric Thin Film Interface Morphology Using a Phase-Field Method

Speaker Name: 
John Sevic
Speaker Title: 
PhD Candidate (Advisor: Nobuhiko Kobayashi)
Speaker Organization: 
Electrical and Computer Engineering
Start Time: 
Tuesday, May 14, 2019 - 11:00am
Engineering 2 Building, Room 215
Nobuhiko Kobayashi

A phase field method is used to computationally study conducting channel morphology of resistive switching thin film structures. Our approach successfully pre- dicts the formation of conducting channels in typical dielectric thin film structures, comparable to a range of resistive switches, offering an alternative computational for- mulation based on metastable states treated at the atomic scale. In contrast to previous resistive switching thin film models, our formulation makes no a priori assumptions on conducting channel morphology and its fundamental transport mechanisms.